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Data for paper: Avalanche breakdown characteristics of Al1-xGaxAsSb quaternary alloys

Version 2 2016-08-03, 13:38
Version 1 2016-08-03, 11:49
dataset
posted on 2016-08-03, 13:38 authored by Xinxin ZhouXinxin Zhou, Shiyong ZhangShiyong Zhang, John DavidJohn David, Jo Shien Ng, Chee TanChee Tan

The files correspond to experimental results in paper: “Avalanche breakdown characteristics of Al1-xGaxAsSb quaternary alloys” DOI: 10.1109/LPT.2016.2601651.


There are two types of files:

-.PNG, which corresponds to the figures

-.CSV, which are raw data in figures

The work in this paper mainly focus on the experiments to accurately determine avalanche breakdown characteristics of Al1-xGaxAs0.56Sb0.44 for x = 0 to 0.15. The test structures were p-i-n diodes with 100 nm avalanche layers to maximize usefulness of the results for high bandwidth APDs. In addition, due to a lack of experimental reports, this work included experimental confirmation of minimum bandgaps, Eg, of Al1-xGaxAs0.56Sb0.44.

The data consists of results from Al1-xGaxAs0.56Sb0.44 avalanche photodiodes (x = 0 to 0.15): photoresponse, dark current, capacitance, bandgap, avalanche gain and breakdown voltage. More details about these data/figures can be found in README file.



Funding

EPSRC grant: EP/K001469/1; EU Marie-Curie Training Network PROMIS Grant: H2020-MSCA-ITN-2014-641899

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    Department of Electronic and Electrical Engineering

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