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Data Package for "Assessing the quality of Oxygen-Plasma focused ion beam (O-PFIB) etching on polypropylene surfaces using Secondary Electron Hyperspectral Imaging"
Data Package for "Assessing the quality of Oxygen-Plasma focused ion beam (O-PFIB) etching on polypropylene surfaces using Secondary Electron Hyperspectral Imaging" https://doi.org/10.3390/polym15153247
Please read Article: https://doi.org/10.3390/polym15153247 to understand the data presented.
Funding
SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimisation for Reliable Manufacturing of Key Materials
Engineering and Physical Sciences Research Council
Find out more...DTP 2020-2021 University of Sheffield
Engineering and Physical Sciences Research Council
Find out more...History
Ethics
- There is no personal data or any that requires ethical approval
Policy
- The data complies with the institution and funders' policies on access and sharing
Sharing and access restrictions
- An appropriate embargo period has been set
Data description
- The file formats are open or commonly used
Methodology, headings and units
- Headings and units are explained in the files
