Data for paper: Thin Al1-xGaxAs0.56Sb0.44 diodes with low excess noise
datasetposted on 14.07.2017 by Xinxin Zhou, Lucas Pinel, Simon Dimler, Shiyong Zhang, Jo Ng, Chee Tan
Datasets usually provide raw data for analysis. This raw data often comes in spreadsheet form, but can be any collection of data, on which analysis can be performed.
The files correspond to experimental results in paper: "Thin Al1-xGaxAs0.56Sb0.44 diodes with low excess noise" published in IEEE Journal of Selected Topics in Quantum Electronics, DOI: https://doi.org/10.1109/JSTQE.2017.2725441
There are two types of files:
- .png, which correspond to the figures
- .csv, which are raw data in figures
This work reports the excess noise characterization in a series of Al1-xGaxAs0.56Sb0.44 (x = 0, 0.05, 0.1, 0.15) diodes with avalanche layer thickness of 110-116 nm.
The data consists of results from Al1-xGaxAs0.56Sb0.44 (x = 0, 0.05, 0.1, 0.15) photodiodes: dark and photocurrent, capacitance, avalanche gain, excess noise.